Publication:

Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices

Date

Loading...
Thumbnail Image

Abstract

Description

Statistics

Views

2042 since deposited on 2021-09-29
Acq. date: 2026-02-27

Citations

Statistics

Views

2042 since deposited on 2021-09-29
Acq. date: 2026-02-27

Citations