Publication:

The impact of high-energy proton irradiation on the low-frequency 1/f noise in FZ-silicon diodes

Date

1999
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-14T11:38:49Z
dc.date.available2021-10-14T11:38:49Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3823
dc.source.beginpage157
dc.source.conferenceProceedings 1st ENDEASD Workshop; European Network on Defect Engineering of Advanced Semiconductor Devices
dc.source.conferencedate21/04/1999
dc.source.conferencelocationSantorini Greece
dc.source.endpage166
dc.title

The impact of high-energy proton irradiation on the low-frequency 1/f noise in FZ-silicon diodes

dc.typeProceedings paper
dspace.entity.typePublication
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