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Articles
MOSFET bias dependent series resistance extraction from RF measurements
Publication:
MOSFET bias dependent series resistance extraction from RF measurements
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Date
2003-10
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Torres-Torres, Reydezel
;
Murphy-Arteaga, R.S.
;
Decoutere, Stefaan
Journal
Electronics Letters
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1837
since deposited on 2021-10-15
Acq. date: 2025-12-17
Citations
Metrics
Views
1837
since deposited on 2021-10-15
Acq. date: 2025-12-17
Citations