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Relation between hole traps and non-reactive hydrogen induced positive charges

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dc.contributor.authorZhang, J.
dc.contributor.authorZhao, C.D.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDegraeve, Robin
dc.contributor.authorEllis, J. N.
dc.contributor.authorBeech, C. D.
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.date.accessioned2021-10-14T18:31:15Z
dc.date.available2021-10-14T18:31:15Z
dc.date.issued2001
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/5870
dc.source.beginpage67
dc.source.endpage72
dc.source.issue1_4
dc.source.journalMicroelectronic Engineering
dc.source.volume59
dc.title

Relation between hole traps and non-reactive hydrogen induced positive charges

dc.typeJournal article
dspace.entity.typePublication
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