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Extreme wafer thinning optimization for via-last applications
Publication:
Extreme wafer thinning optimization for via-last applications
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jourdain, Anne
;
De Vos, Joeri
;
Inoue, Fumihiro
;
Rebibis, Kenneth June
;
Miller, Andy
;
Beyer, Gerald
;
Beyne, Eric
;
Walsby, Edward
;
Patel, Jash
;
Ansell, Oliver
;
Hopkins, Janet
;
Ashraf, Huma
;
Thomas, Dave
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1954
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations
Metrics
Views
1954
since deposited on 2021-10-23
Acq. date: 2025-10-25
Citations