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Conference contributions
Computational nanometrology of line edge roughness: recent challenges and advances
Publication:
Computational nanometrology of line edge roughness: recent challenges and advances
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Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Constantoudis, Vassilios
;
Papavieros, George
;
Lorusso, Gian
;
Gogolides, Evangelos
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1886
since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations
Metrics
Views
1886
since deposited on 2021-10-24
Acq. date: 2025-12-10
Citations