Publication:
How reliable are reliability tests?
Date
| dc.contributor.author | Tielemans, L. | |
| dc.contributor.author | Rongen, R. | |
| dc.contributor.author | De Ceuninck, Ward | |
| dc.contributor.imecauthor | De Ceuninck, Ward | |
| dc.date.accessioned | 2021-10-14T23:21:56Z | |
| dc.date.available | 2021-10-14T23:21:56Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6881 | |
| dc.source.beginpage | 1339 | |
| dc.source.endpage | 1345 | |
| dc.source.issue | 9_11 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 42 | |
| dc.title | How reliable are reliability tests? | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
| |
| Publication available in collections: |