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Analysis of substrate noise propagation in a lightly doped substrate

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dc.contributor.authorVan der Plas, Geert
dc.contributor.authorSoens, Charlotte
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorWambacq, Piet
dc.contributor.authorDonnay, Stephane
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorSoens, Charlotte
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.date.accessioned2021-10-15T16:55:50Z
dc.date.available2021-10-15T16:55:50Z
dc.date.issued2004-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/9732
dc.source.beginpage361
dc.source.conferenceProceedings of the 34th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate20/09/2004
dc.source.conferencelocationLeuven Belgium
dc.source.endpage364
dc.title

Analysis of substrate noise propagation in a lightly doped substrate

dc.typeProceedings paper
dspace.entity.typePublication
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