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The impact of PEALD TaN barrier processes on different ultra low-k dielectrics
Publication:
The impact of PEALD TaN barrier processes on different ultra low-k dielectrics
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Xunyuan
;
Gillot, Christophe
;
Zhao, Larry
;
Ryan, E. Todd
;
Wu, Chen
Journal
ECS Journal of Solid State Science and Technology
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1830
since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations
Metrics
Views
1830
since deposited on 2021-10-23
Acq. date: 2025-12-11
Citations