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Time dependent dielectric breakdown study of organo silicate glass materials over a wide range of k-values
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Time dependent dielectric breakdown study of organo silicate glass materials over a wide range of k-values
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Date
2012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Barbarin, Yohan
;
Zhao, Larry
;
Verdonck, Patrick
;
Baklanov, Mikhaïl
;
Croes, Kristof
;
Tokei, Zsolt
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1818
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations
Metrics
Views
1818
since deposited on 2021-10-20
Acq. date: 2025-12-15
Citations