Publication:

DC and RF Characterization of Nano-ridge HBT Technology Integrated on 300 mm Si Substrates

Date

2021

Proceedings Paper

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Author(s)

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ElKashlan, Rana Y.

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Witters, Liesbeth

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Vondkar Kodandarama, Komal

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Alcotte, Reynald

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Kunert, Bernardette

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Parvais, Bertrand

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Collaert, Nadine

Journal

na

Metrics

1822 since deposited on 2021-11-02

Acq. date: 2025-12-13