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Development of a dielectric CMP process for replacement gate applications
Publication:
Development of a dielectric CMP process for replacement gate applications
Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Devriendt, Katia
;
Ong, Patrick
;
Kellens, Kristof
;
Veloso, Anabela
;
Crabbe, Yvo
;
Brus, Stephan
;
Claes, Martine
;
Leunissen, Peter
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1935
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
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Views
1935
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations