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Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique
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Explanation of anomalous erase behaviour and the associated device instability in TANOS Flash using a new trap characterization technique
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Zahid, Mohammed
;
Van den Bosch, Geert
;
Blomme, Pieter
;
Breuil, Laurent
;
Kaczer, Ben
;
Mercuri, Marco
;
Rothschild, Aude
;
Cacciato, Antonio
;
Jurczak, Gosia
;
Groeseneken, Guido
;
Van Houdt, Jan
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1993
since deposited on 2021-10-17
Acq. date: 2026-07-17
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Views
1993
since deposited on 2021-10-17
Acq. date: 2026-07-17
Citations