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On the correlation between static and low-frequency noise parameters of vertical nanowire nMOSFETs

Date

2020
Proceedings Paper
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorMatagne, Philippe
dc.contributor.authorRosseel, Erik
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorLoo, Roger
dc.contributor.authorFavia, Paola
dc.contributor.authorBender, Hugo
dc.contributor.authorVancoille, Eric
dc.contributor.authorVeloso, Anabela
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorRosseel, Erik
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVancoille, Eric
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.date.accessioned2021-10-29T04:10:27Z
dc.date.available2021-10-29T04:10:27Z
dc.date.embargo9999-12-31
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35949
dc.identifier.urlhttps://doi.org/10.1149/09705.0059ecst
dc.source.beginpage59
dc.source.conference237th ECS Spring Meeting - Advanced CMOS-compatible Semiconductor Devices 19
dc.source.conferencedate10/05/2020
dc.source.conferencelocationBristol UK
dc.source.endpage64
dc.title

On the correlation between static and low-frequency noise parameters of vertical nanowire nMOSFETs

dc.typeProceedings paper
dspace.entity.typePublication
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