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Back and front interface related generation-recombination noise in buried-channel SOI p-MOSFET's
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Back and front interface related generation-recombination noise in buried-channel SOI p-MOSFET's
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.
;
Petrichuk, M.
;
Garbar, N.
;
Simoen, Eddy
;
Claeys, Cor
Journal
IEEE Transactions on Electron Devices
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2082
since deposited on 2021-09-29
1
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Acq. date: 2025-12-11
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Metrics
Views
2082
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-11
Citations