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Conference contributions
Process and device modeling and characterization needs for deep submicron CMOS technology
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Process and device modeling and characterization needs for deep submicron CMOS technology
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Date
1998
Proceedings Paper
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2678.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Meyer, Kristin
Journal
Abstract
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1827
since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations
Metrics
Views
1827
since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations