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Conference contributions
Strain relaxation and distribution in GaN nanopillars using in-plane X-ray diffraction
Publication:
Strain relaxation and distribution in GaN nanopillars using in-plane X-ray diffraction
Date
2012
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tseng, Peter
;
Dillemans, Leander
;
Gonzalez, Mario
;
Cheng, Kai
;
Borghs, Gustaaf
;
Lieten, Ruben
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Abstract
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1892
since deposited on 2021-10-20
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1892
since deposited on 2021-10-20
411
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations