Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states
Publication:
Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states
Date
2005-04
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Croon, Jeroen
;
Kaczer, Ben
;
Lujan, Guilherme
;
Kubicek, Stefan
;
Groeseneken, Guido
;
Meuris, Marc
Journal
Abstract
Description
Metrics
Views
1938
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1938
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations