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The importance of the determination of polysilicon dopant profile during process development
Publication:
The importance of the determination of polysilicon dopant profile during process development
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Date
1995
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Debusschere, Ingrid
;
Deferm, Ludo
;
Vandervorst, Wilfried
Journal
Abstract
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1890
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Acq. date: 2025-12-16
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Metrics
Views
1890
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-16
Citations