Publication:

High-frequency noise performance of 60-nm gate-length FinFETs

Date

2008
Journal article
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Author(s)

Raskin, Jean-Pierre
;
Pailloncy, Guillaume
;
Lederer, Dimitri  
;
Danneville, Francois
;
Dambrine, Gilles
;
Decoutere, Stefaan  
;
Mercha, Abdelkarim  
;
Parvais, Bertrand  

Journal

IEEE Transactions on Electron Devices

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1910 since deposited on 2021-10-17
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