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Cleaning of metal gate stacks for the sub 90nm technology node
Publication:
Cleaning of metal gate stacks for the sub 90nm technology node
Date
2004
Proceedings Paper
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15640.pdf
600.38 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Snow, Jim
;
Kraus, Harald
;
Vermeyen, Kenneth
;
Fyen, Wim
;
Mertens, Paul
;
Kovacs, Frederic
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1917
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1917
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations