Publication:

An investigation on border traps in III-V MOSFETs with an In0.53Ga0.47As channel

Date

2015

Journal article

Simple item page Full metadata Statistics

Files

33154.pdf 2.15 MB

Author(s)

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Zhang, Wei Dong

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Linten, Dimitri

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Collaert, Nadine

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De Gendt, Stefan

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Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

Metrics

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Acq. date: 2025-12-09