Publication:

An investigation on border traps in III-V MOSFETs with an In0.53Ga0.47As channel

Date

2015
Journal article
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

33154.pdf 2.15 MB

Author(s)

Ji, Zhigang
;
Zhang, Xiong
;
Franco, Jacopo  
;
Gao, Rui
;
Duan, Meng
;
Zhang, Jian Fu
;
Zhang, Wei Dong
;
Kaczer, Ben  
;
Alian, AliReza  
;
Linten, Dimitri  
;
Zhou, Daisy  
;
Collaert, Nadine  
;
De Gendt, Stefan  
;
Groeseneken, Guido  

Journal

IEEE Transactions on Electron Devices

Abstract

Description

Statistics

Views

1922 since deposited on 2021-10-22
2last month
Acq. date: 2026-01-25

Citations

Statistics

Views

1922 since deposited on 2021-10-22
2last month
Acq. date: 2026-01-25

Citations