Publication:
Trap-assisted tunneling in high permittivity gate dielectric stacks
Date
| dc.contributor.author | Houssa, Michel | |
| dc.contributor.author | Tuominen, Marko | |
| dc.contributor.author | Naili, Mohamed | |
| dc.contributor.author | Afanas'ev, V. | |
| dc.contributor.author | Stesmans, Andre | |
| dc.contributor.author | Haukka, S. | |
| dc.contributor.author | Heyns, Marc | |
| dc.contributor.imecauthor | Houssa, Michel | |
| dc.contributor.imecauthor | Stesmans, Andre | |
| dc.contributor.imecauthor | Heyns, Marc | |
| dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
| dc.date.accessioned | 2021-10-14T13:05:15Z | |
| dc.date.available | 2021-10-14T13:05:15Z | |
| dc.date.issued | 2000 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/4439 | |
| dc.source.beginpage | 8615 | |
| dc.source.endpage | 8620 | |
| dc.source.issue | 12 | |
| dc.source.journal | J. Appl. Physics | |
| dc.source.volume | 87 | |
| dc.title | Trap-assisted tunneling in high permittivity gate dielectric stacks | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |