Publication:
The Atomic Force Microscopy for Nanoelectronics
Date
| dc.contributor.author | Celano, Umberto | |
| dc.contributor.imecauthor | Celano, Umberto | |
| dc.contributor.orcidimec | Celano, Umberto::0000-0002-2856-3847 | |
| dc.date.accessioned | 2021-10-27T07:53:45Z | |
| dc.date.available | 2021-10-27T07:53:45Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/32664 | |
| dc.identifier.url | https://www.springer.com/gp/book/9783030156114 | |
| dc.source.beginpage | 1 | |
| dc.source.book | Electrical AFM for nanoelectronics | |
| dc.source.endpage | 28 | |
| dc.title | The Atomic Force Microscopy for Nanoelectronics | |
| dc.type | Book chapter | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |