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Nanolayer characterisation by reference-free X-ray fluorescence analysis with synchrotron radiation
Publication:
Nanolayer characterisation by reference-free X-ray fluorescence analysis with synchrotron radiation
Date
2009
Meeting abstract
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19297.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kolbe, M.
;
Beckhoff, B.
;
Krumrey, M.
;
Reading, M.A.
;
van den Berg, J.A.
;
Conard, Thierry
;
De Gendt, Stefan
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1913
since deposited on 2021-10-17
413
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1913
since deposited on 2021-10-17
413
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations