Publication:
Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches
Date
| dc.contributor.author | Czarnecki, Piotr | |
| dc.contributor.author | Rottenberg, Xavier | |
| dc.contributor.author | Puers, Bob | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.imecauthor | Czarnecki, Piotr | |
| dc.contributor.imecauthor | Rottenberg, Xavier | |
| dc.contributor.imecauthor | Puers, Bob | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.date.accessioned | 2021-10-16T01:04:34Z | |
| dc.date.available | 2021-10-16T01:04:34Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10276 | |
| dc.source.beginpage | 133 | |
| dc.source.conference | Proceedings MEMSWAVE Workshop | |
| dc.source.conferencedate | 23/06/2005 | |
| dc.source.conferencelocation | Lausanne Switzerland | |
| dc.source.endpage | 136 | |
| dc.title | Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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