Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Correlation between pattern density and linewidth variation in silicon photonics waveguides
Publication:
Correlation between pattern density and linewidth variation in silicon photonics waveguides
Copy permalink
Date
2020
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
45378.pdf
1.13 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xing, Yufei
;
Dong, Jiaxing
;
Khan, Muhammad Umar
;
Bogaerts, Wim
Journal
Optics Express
Abstract
Description
Statistics
Views
1960
since deposited on 2021-10-29
Acq. date: 2026-07-17
Citations
Statistics
Views
1960
since deposited on 2021-10-29
Acq. date: 2026-07-17
Citations