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Experimental determination of the apex temperature of a semiconducting tip during laser-assisted atom probe tomography
Publication:
Experimental determination of the apex temperature of a semiconducting tip during laser-assisted atom probe tomography
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kumar, Arul
;
Demeulemeester, Jelle
;
Bogdanowicz, Janusz
;
Bran, Julien
;
Melkonyan, Davit
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1940
since deposited on 2021-10-22
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last month
Acq. date: 2026-01-08
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Metrics
Views
1940
since deposited on 2021-10-22
2
last month
Acq. date: 2026-01-08
Citations