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Integration challenges for multi-gate devices
Publication:
Integration challenges for multi-gate devices
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Collaert, Nadine
;
Brus, Stephan
;
De Keersgieter, An
;
Dixit, Abhisek
;
Ferain, Isabelle
;
Goodwin, Michael
;
Kottantharayil, Anil
;
Rooyackers, Rita
;
Verheyen, Peter
;
Yim, Yong Sik
;
Zimmerman, Paul
;
Beckx, Stephan
;
Degroote, Bart
;
Demand, Marc
;
Kim, Myeong-Cheol
;
Kunnen, Eddy
;
Locorotondo, Sabrina
;
Mannaert, Geert
;
Neuilly, Francois
;
Shamiryan, Denis
;
Baerts, Christina
;
Ercken, Monique
;
Laidler, David
;
Leys, Frederik
;
Loo, Roger
;
Lisoni, Judit
;
Snow, Jim
;
Vos, Rita
;
Boullart, Werner
;
Pollentier, Ivan
;
De Gendt, Stefan
;
De Meyer, Kristin
;
Jurczak, Gosia
;
Biesemans, Serge
Journal
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1974
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1974
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations