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Monitoring plasma nitridation of HfSiOx by corona charge measurements
Publication:
Monitoring plasma nitridation of HfSiOx by corona charge measurements
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Everaert, Jean-Luc
;
Shi, Xiaoping
;
Rothschild, Aude
;
Schaekers, Marc
;
Rosseel, Erik
;
Pavelka, Tibor
;
Don, Eric
;
Vanhaelemeersch, Serge
Journal
Microelectronic Engineering
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Views
1863
since deposited on 2021-10-16
1
last month
1
last week
Acq. date: 2025-12-12
Citations