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Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI
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Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Li, Xiangdong
;
Zhao, Ming
;
Bakeroot, Benoit
;
Geens, Karen
;
Guo, Weiming
;
Lempinen, Vesa-Pekka
;
Sormunen, Jaakko
;
Groeseneken, Guido
;
Decoutere, Stefaan
Journal
IEEE Transactions on Electron Devices
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2045
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Acq. date: 2025-12-10
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Views
2045
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-10
Citations