Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI

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39041.pdf 3.52 MB

Author(s)

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Bakeroot, Benoit

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Lempinen, Vesa-Pekka

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Sormunen, Jaakko

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Groeseneken, Guido

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Decoutere, Stefaan

Journal

IEEE Transactions on Electron Devices

Metrics

2041 since deposited on 2021-10-27

Acq. date: 2025-10-23