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Capacitance-voltage characterization of GaAs-Oxide interfaces
Publication:
Capacitance-voltage characterization of GaAs-Oxide interfaces
Date
2008
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Brammertz, Guy
;
Lin, Dennis
;
Martens, Koen
;
Mercier, David
;
Merckling, Clement
;
Penaud, Julien
;
Adelmann, Christoph
;
Sioncke, Sonja
;
Wang, Wei-E
;
Caymax, Matty
;
Meuris, Marc
;
Heyns, Marc
Journal
Journal of the Electrochemical Society
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1945
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1945
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations