Publication:
Effect of annealing ferroelectric HfO2 thin films: In situ, high temperature X-ray diffraction
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1930 since deposited on 2021-10-26
1last month
Acq. date: 2026-05-16
Citations
Statistics
Views
1930 since deposited on 2021-10-26
1last month
Acq. date: 2026-05-16
Citations