Publication:
Depth localization of trapped holes in SiON pMOSFETs after positive and negative gate stress
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1786 since deposited on 2021-10-18
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Acq. date: 2026-10-08
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Statistics
Views
1786 since deposited on 2021-10-18
1last month
1last week
Acq. date: 2026-10-08
Citations