Publication:
Variability study with CD-SEM metrology for STT-MRAM: correlation analysis between physical dimensions and electrical property of the memory element
Loading...
Files
Journal
Abstract
Description
Metrics
Views
2111 since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations
Metrics
Views
2111 since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations