Publication:

Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays

Date

1995
Proceedings Paper
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dc.contributor.authorVan Houdt, Jan
dc.contributor.authorWellekens, Dirk
dc.contributor.authorVanhorebeek, Guido
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorDeferm, Ludo
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorDeferm, Ludo
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-09-29T13:19:51Z
dc.date.available2021-09-29T13:19:51Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/947
dc.source.beginpage553
dc.source.conference25th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate25/09/1995
dc.source.conferencelocationDen Haag The Netherlands
dc.source.endpage556
dc.title

Investigation and suppression of the gate disturb effect in source side injection flash EEPROM arrays

dc.typeProceedings paper
dspace.entity.typePublication
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