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Double patterning with dual hard mask for 28nm node devices and below
Publication:
Double patterning with dual hard mask for 28nm node devices and below
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Date
2013
Proceedings Paper
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27170.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hody, Hubert
;
Paraschiv, Vasile
;
Vecchio, Emma
;
Locorotondo, Sabrina
;
Winroth, Gustaf
;
Athimulam, Raja
;
Boullart, Werner
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1992
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-10
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Metrics
Views
1992
since deposited on 2021-10-21
1
last month
Acq. date: 2025-12-10
Citations