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Analysis of the pre-epi bake conditions on the defect creation in recessed Si1-xGex S/D junctions
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Analysis of the pre-epi bake conditions on the defect creation in recessed Si1-xGex S/D junctions
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Date
2007
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bargallo Gonzalez, Mireia
;
Thomas, Nicole
;
Simoen, Eddy
;
Verheyen, Peter
;
Hikavyy, Andriy
;
Leys, Frederik
;
Okuno, Yasutoshi
;
Vissouvanadin Soubaretty, Bertrand
;
Van Daele, Benny
;
Geenen, Luc
;
Loo, Roger
;
Claeys, Cor
;
Machkaoutsan, Vladimir
;
Tomasini, P.
;
Thomas, S.G.
;
Lu, J.P.
;
Weijtmans, J.W.
;
Wise, R.
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1982
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Acq. date: 2026-01-26
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Views
1982
since deposited on 2021-10-16
4
last month
1
last week
Acq. date: 2026-01-26
Citations