Publication:

Analysis of the pre-epi bake conditions on the defect creation in recessed Si1-xGex S/D junctions

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1977 since deposited on 2021-10-16
1last month
Acq. date: 2025-12-08

Citations

Metrics

Views

1977 since deposited on 2021-10-16
1last month
Acq. date: 2025-12-08

Citations