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Static and low frequency noise characterization of FinFET devices
Publication:
Static and low frequency noise characterization of FinFET devices
Date
2009
Proceedings Paper
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18110.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bennamane, K.
;
Boutchacha, T.
;
Ghibaudo, G.
;
Mouis, M.
;
Collaert, Nadine
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Abstract
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1841
since deposited on 2021-10-17
Acq. date: 2025-10-26
Citations
Metrics
Views
1841
since deposited on 2021-10-17
Acq. date: 2025-10-26
Citations