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Conference contributions
A novel test structure to study intrinsic reliability of barrier/low-k
Publication:
A novel test structure to study intrinsic reliability of barrier/low-k
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Date
2009
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhao, Larry
;
Tokei, Zsolt
;
Gianni, Giai Gischia
;
Pantouvaki, Marianna
;
Croes, Kristof
;
Beyer, Gerald
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1928
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-10
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Metrics
Views
1928
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-10
Citations