Publication:
Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
Date
| dc.contributor.author | Michl, J. | |
| dc.contributor.author | Grill, A. | |
| dc.contributor.author | Claes, D. | |
| dc.contributor.author | Rzepa, G. | |
| dc.contributor.author | Kaczer, B. | |
| dc.contributor.author | Linten, D. | |
| dc.contributor.author | Radu, I | |
| dc.contributor.author | Grasser, T. | |
| dc.contributor.author | Waltl, M. | |
| dc.contributor.imecauthor | Grill, A. | |
| dc.contributor.imecauthor | Claes, D. | |
| dc.contributor.imecauthor | Kaczer, B. | |
| dc.contributor.imecauthor | Linten, D. | |
| dc.contributor.imecauthor | Radu, I | |
| dc.contributor.orcidext | Waltl, M.::0000-0001-6042-759X | |
| dc.contributor.orcidimec | Radu, I::0000-0002-7230-7218 | |
| dc.date.accessioned | 2022-01-20T10:39:13Z | |
| dc.date.available | 2021-11-02T16:05:48Z | |
| dc.date.available | 2022-01-20T10:39:13Z | |
| dc.date.issued | 2020 | |
| dc.identifier.eisbn | 978-1-7281-3199-3 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38227 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | APR 28-MAY 30, 2020 | |
| dc.source.conferencelocation | Dallas, TX, USA | |
| dc.source.journal | na | |
| dc.source.numberofpages | 6 | |
| dc.title | Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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