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Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications

 
dc.contributor.authorDiaz Fortuny, Javier
dc.contributor.authorSaraza Canflanca, Pablo
dc.contributor.authorVandemaele, Michiel
dc.contributor.authorBury, Erik
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.imecauthorDiaz Fortuny, Javier
dc.contributor.imecauthorSaraza Canflanca, Pablo
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecDiaz Fortuny, Javier::0000-0002-8186-071X
dc.contributor.orcidimecSaraza Canflanca, Pablo::0000-0003-2155-8305
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2023-04-27T15:17:22Z
dc.date.available2023-02-27T03:28:07Z
dc.date.available2023-04-27T15:17:22Z
dc.date.issued2022
dc.description.wosFundingTextWe thank Kai-Hsin Chuang for his assistance in design and layout of various FET arrays. This work was supported in part by the CyberSecurity Research Flanders with reference number VR20192203.
dc.identifier.doi10.1109/LAEDC54796.2022.9908187
dc.identifier.eisbn978-1-6654-9767-1
dc.identifier.issnna
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41166
dc.publisherIEEE
dc.source.conferenceIEEE Latin American Electron Devices Conference (LAEDC)
dc.source.conferencedateJUL 04-06, 2022
dc.source.conferencelocationPuebla
dc.source.journalna
dc.source.numberofpages4
dc.title

Dedicated ICs for the Characterization of Variability and Aging Studies and their Use in Lightweight Security Applications

dc.typeProceedings paper
dspace.entity.typePublication
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