Publication:

Bayesian active learning for multi-objective feasible region identification in microwave devices

Date

2021
Journal article
https://doi.org/10.1049/ell2.12022
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dc.contributor.authorGarbuglia, Federico
dc.contributor.authorQing, Jixiang
dc.contributor.authorKnudde, Nicolas
dc.contributor.authorSpina, Domenico
dc.contributor.authorCouckuyt, Ivo
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorDhaene, Tom
dc.contributor.imecauthorGarbuglia, Federico
dc.contributor.imecauthorQing, Jixiang
dc.contributor.imecauthorKnudde, Nicolas
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorCouckuyt, Ivo
dc.contributor.imecauthorDeschrijver, Dirk
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidimecQing, Jixiang::0000-0002-6446-6286
dc.contributor.orcidimecGarbuglia, Federico::0000-0002-1917-1921
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.contributor.orcidimecCouckuyt, Ivo::0000-0002-9524-4205
dc.contributor.orcidimecDeschrijver, Dirk::0000-0001-6600-1792
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.date.accessioned2022-03-07T09:35:04Z
dc.date.available2022-03-07T09:35:04Z
dc.date.issued2021
dc.identifier.doi10.1049/ell2.12022
dc.identifier.issn0013-5194
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39322
dc.publisherWILEY
dc.source.beginpage400
dc.source.endpage403
dc.source.issue10
dc.source.journalELECTRONICS LETTERS
dc.source.numberofpages4
dc.source.volume57
dc.title

Bayesian active learning for multi-objective feasible region identification in microwave devices

dc.typeJournal article
dspace.entity.typePublication
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