Publication:

High temperature electron irradiation effects in InGaAs photodiodes

Date

2003
Presentation
Simple item page Full metadata Statistics
 
dc.contributor.authorOhyama, H.
dc.contributor.authorTakakura, K.
dc.contributor.authorHayama, K.
dc.contributor.authorHirao, T.
dc.contributor.authorOnoda, S.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-15T05:53:12Z
dc.date.available2021-10-15T05:53:12Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7941
dc.source.conferenceGettering and Defect Engineering in Semiconductor Technology - GADEST
dc.source.conferencedate20/09/2003
dc.source.conferencelocationBerlin Germany
dc.title

High temperature electron irradiation effects in InGaAs photodiodes

dc.typeOral presentation
dspace.entity.typePublication
Files
Publication available in collections:
Presentations