Publication:

Focused ion beam sample preparation: applications in materials science

Date

2003
Presentation
Simple item page Full metadata Statistics
 
dc.contributor.authorBender, Hugo
dc.contributor.authorBenedetti, Alessandro
dc.contributor.authorRichard, Olivier
dc.contributor.authorVan Marcke, Patricia
dc.contributor.authorDrijbooms, Chris
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVan Marcke, Patricia
dc.contributor.imecauthorDrijbooms, Chris
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.date.accessioned2021-10-15T04:00:36Z
dc.date.available2021-10-15T04:00:36Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7194
dc.source.conferenceMicroscopies in Mediterranean Area, 8th Congress of the French Society of Microscopie - MiMeA
dc.source.conferencedate23/06/2003
dc.source.conferencelocationToulon France
dc.title

Focused ion beam sample preparation: applications in materials science

dc.typeOral presentation
dspace.entity.typePublication
Files
Publication available in collections:
Presentations