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Investigation of preexisting and generated defects in nonfilamentary a-Si/TiO2 RRAM and their impacts on RTN amplitude distribution
Publication:
Investigation of preexisting and generated defects in nonfilamentary a-Si/TiO2 RRAM and their impacts on RTN amplitude distribution
Date
2018
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ma, Jigang
;
Chai, Zheng
;
Zhang, Wei Dong
;
Zhang, J. F.
;
Ji, Z.
;
Benbakhti, Brahim
;
Govoreanu, Bogdan
;
Simoen, Eddy
;
Goux, Ludovic
;
Belmonte, Attilio
;
Degraeve, Robin
;
Kar, Gouri Sankar
;
Jurczak, Gosia
Journal
IEEE Transactions on Electron Devices
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1934
since deposited on 2021-10-25
Acq. date: 2025-10-24
Citations
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Views
1934
since deposited on 2021-10-25
Acq. date: 2025-10-24
Citations