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Temporal sequence learning with a history-sensitive probabilistic learning rule intrinsic to oxygen vacancy-based RRAM

Date

2018
Proceedings Paper
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dc.contributor.authorDoevenspeck, Jonas
dc.contributor.authorDegraeve, Robin
dc.contributor.authorFantini, Andrea
dc.contributor.authorDebacker, Peter
dc.contributor.authorVerkest, Diederik
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorDehaene, Wim
dc.contributor.imecauthorDoevenspeck, Jonas
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.accessioned2021-10-25T18:19:27Z
dc.date.available2021-10-25T18:19:27Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30649
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8614627
dc.source.beginpage480
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate1/12/2018
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage483
dc.title

Temporal sequence learning with a history-sensitive probabilistic learning rule intrinsic to oxygen vacancy-based RRAM

dc.typeProceedings paper
dspace.entity.typePublication
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