Publication:

The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography

Date

2023
Journal article
https://doi.org/10.1093/micmic/ozac022
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dc.contributor.authorClark, Laura
dc.contributor.authorMartinez Alanis, Gerardo Tadeo
dc.contributor.authorOLeary, Colum M.
dc.contributor.authorYang, Hao
dc.contributor.authorDing, Zhiyuan
dc.contributor.authorPetersen, Timothy C.
dc.contributor.authorFindlay, Scott D.
dc.contributor.authorNellist, Peter D.
dc.contributor.imecauthorMartinez Alanis, Gerardo Tadeo
dc.contributor.orcidimecMartinez Alanis, Gerardo Tadeo::0000-0001-5036-0491
dc.date.accessioned2024-04-25T12:42:48Z
dc.date.available2023-08-18T17:33:33Z
dc.date.available2024-04-25T12:42:48Z
dc.date.embargo2022-09-07
dc.date.issued2023
dc.identifier.doi10.1093/micmic/ozac022
dc.identifier.issn1431-9276
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42347
dc.publisherOXFORD UNIV PRESS
dc.source.beginpage384
dc.source.endpage394
dc.source.issue1
dc.source.journalMICROSCOPY AND MICROANALYSIS
dc.source.numberofpages11
dc.source.volume29
dc.subject.keywordsCONTRAST
dc.subject.keywordsSTEM
dc.subject.keywordsDETECTOR
dc.subject.keywordsMICROSCOPY
dc.subject.keywordsRECONSTRUCTION
dc.subject.keywordsSPECIMENS
dc.subject.keywordsELEMENTS
dc.subject.keywords4D-STEM
dc.subject.keywordsLIGHT
dc.title

The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography

dc.typeJournal article
dspace.entity.typePublication
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