Publication:
Degradation and recovery of Si1-xGex devices after proton irradiation
Date
| dc.contributor.author | Ohyama, Hidenori | |
| dc.contributor.author | Vanhellemont, Jan | |
| dc.contributor.author | Takami, Y. | |
| dc.contributor.author | Hayama, Kiyoteru | |
| dc.contributor.author | Sunaga, H. | |
| dc.contributor.author | Nashiyama, I. | |
| dc.contributor.author | Uwatoko, Y. | |
| dc.contributor.author | Poortmans, Jef | |
| dc.contributor.author | Caymax, Matty | |
| dc.contributor.imecauthor | Poortmans, Jef | |
| dc.contributor.imecauthor | Caymax, Matty | |
| dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
| dc.date.accessioned | 2021-09-29T15:15:15Z | |
| dc.date.available | 2021-09-29T15:15:15Z | |
| dc.date.issued | 1996 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1387 | |
| dc.source.conference | Materials Research Society Spring Meeting. Symposium F on GeSi and Related Compounds; April 9-11, 1996; San Francisco, Calif., U | |
| dc.source.conferencelocation | ||
| dc.title | Degradation and recovery of Si1-xGex devices after proton irradiation | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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