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On the electrical characterization of grain boundaries in multicrytalline silicon
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On the electrical characterization of grain boundaries in multicrytalline silicon
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Jiahe
;
Cornagliotti, Emanuele
;
Hieckmann, E.
;
Berendt, S.
;
Weber, J.
;
Simoen, Eddy
;
Poortmans, Jef
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1937
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-10
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Metrics
Views
1937
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-10
Citations