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On the electrical characterization of grain boundaries in multicrytalline silicon
Publication:
On the electrical characterization of grain boundaries in multicrytalline silicon
Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Jiahe
;
Cornagliotti, Emanuele
;
Hieckmann, E.
;
Berendt, S.
;
Weber, J.
;
Simoen, Eddy
;
Poortmans, Jef
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1935
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations
Metrics
Views
1935
since deposited on 2021-10-19
Acq. date: 2025-10-24
Citations